Crystallite size
Micro-strain/stress
Non-ambient temperature studies
In-Operando battery analysis
Precise lattice parameter calculation
X-ray reflectivity (XRR)
Epitaxial film analysis
Non-coplanar diffraction
Non-destructive forensic studies
Conservation and cultural heritage
Reverse-engineering
Fisher and fracture mapping
Continuous surface area analysis
Layer and coating boundaries
Void detection
Quality control
Compact benchtop ED-XRF
Mapping with microXRF
Solids, pressed powders, fused eads, and liquids.
Standardless quantification
Pre-calibratied methods for geological materials, metals, petroleum, cement, and more.
X-Ray Diffraction (XRD) reveals the atomic structure and phase composition of crystalline materials. Bruker’s XRD systems deliver precise, non-destructive analysis for research, quality control, and materials characterization.
X-Ray Microscopy (XRM) uses high-resolution X-rays to non-destructively image internal structures in 3D. Bruker’s advanced XRM systems, like the X4 POSEIDON™, support materials research, quality control, and geological analysis with precision and flexibility.
X-Ray Fluorescence (XRF) identifies and quantifies detailed elemental composition in solids, liquids, and powders. Bruker’s advanced XRF systems provide fast, non-destructive analysis for applications in mining, metals, environmental testing, and more.
Explore our selection of quality refurbished systems. reliable, expertly reconditioned instruments backed by KS Analytical’s experience and support, offering proven performance at an exceptional value
Precision.
Innovation.
Reliability.
Why Choose KS Analytical Systems?
Decades of Experience
in X-ray analysis, instrumentation and support.
Trusted Solutions
for research labs, universities, and industrial applications.
Custom Engineering
for unique sample preparation and analysis needs.
Personalized Support
to help you maximize performance and efficiency.