Get in TouchPhase identication / Quantification
Crystallite size
Micro-strain/stress
Non-ambient temperature studies
In-Operando battery analysisXRDNon-destructive Characterization of Material Properties: Bruker's X-ray Diffraction portfolio enables detailed analysis of any material from fundamental research to industrial quality control providing forward looking solutions for our customers.Learn MorePowder xrdReciprocal space mapping
Precise lattice parameter calculation
X-ray reflectivity (XRR)
Epitaxial film analysis
Non-coplanar diffractionhigh-resolution xrdGet in TouchFailure analysis
Non-destructive forensic studies
Conservation and cultural heritage
Reverse-engineering
Fisher and fracture mappingXRMBruker’s 3D X-ray microscopes (XRM) provide turnkey, non-destructive 3D imaging for industrial and scientific use—ideal for inspecting castings, machined and 3D-printed parts, electro-mechanical assemblies, medical tools, pharmaceutical packaging, geological samples, and in-situ applications.Learn MoreInvestigative testingPorosity and density distribution
Continuous surface area analysis
Layer and coating boundaries
Void detection
Quality controlMaterial scienceGet in TouchResearch-grade WDXRF
Compact benchtop ED-XRF
Mapping with microXRF
Solids, pressed powders, fused eads, and liquids.XRFUnlock fast, accurate elemental analysis with Bruker XRF spectrometers. Ideal for testing liquids, solids, and powders with minimal prep. Analyze elements from Beryllium (Be) to Uranium (U) across a wide concentration range, from 100% down to ppm levels. Learn MoreVersatile AnalysisClassic method using standards (SRM)
Standardless quantification
Pre-calibratied methods for geological materials, metals, petroleum, cement, and more.custom calibrations